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The simulation of aging induced degradation mechanisms is a challenging task during the design of digital systems. Parametrical degradations can be handled most accurately at TCAD level, as the physical models like [1] and [2] can be implemented directly. On the other hand, timing failures caused by such degradations cannot be assessed exactly lower than Register Transfer Level (RTL), where the notion...
The simulation of aging related degradation mechanisms is a challenging task for timing and reliability estimations during all design phases of digital systems. Some good approaches towards accurate, efficient and applicable timing models at the register transfer level (RTL) have already been made. However recent state-of-the-art models often have to access lower levels of abstraction, such as the...
Analog-/Mixed-Signal (AMS) design verification is one of the most challenging and time consuming tasks of todays complex system on chip (SoC) designs. In contrast to digital system design, AMS designers have to deal with a continuous state space of conservative quantities, highly nonlinear relationships, non-functional influences, etc. enlarging the number of possibly critical scenarios to infinity...
This paper analyzes some of the secondary effects in estimating negative bias temperature instability (NBTI) induced threshold voltage shift on high frequency digital circuits. Therefore, a circuit model is developed to be used for statistical estimation of the threshold voltage shift. Making use of this model as well as technology computer aided design (TCAD) and SPICE simulations, a methodology...
The aging effect “Negative Bias Temperature Instability”, which is highly dependent on device history, has a direct impact on the design of integrated circuits. In order to make realistic predictions available in the design process, simulation durations of existing history aware models must be significantly reduced. Therefore, a performance-oriented, yet accurate abstraction of the switching trap...
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