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The simulation of aging induced degradation mechanisms is a challenging task during the design of digital systems. Parametrical degradations can be handled most accurately at TCAD level, as the physical models like [1] and [2] can be implemented directly. On the other hand, timing failures caused by such degradations cannot be assessed exactly lower than Register Transfer Level (RTL), where the notion...
The simulation of aging related degradation mechanisms is a challenging task for timing and reliability estimations during all design phases of digital systems. Some good approaches towards accurate, efficient and applicable timing models at the register transfer level (RTL) have already been made. However recent state-of-the-art models often have to access lower levels of abstraction, such as the...
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