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A framework to assess the reliability of an automotive motor controller with power electronics is presented in this paper. In specific, the significant power electronic device inside the controller, i.e., Insulated Gate Bipolar Transistor (IGBT), is modeled and its operation is simulated using the Matlab/Simulink tool. By computing its thermal behavior one can predict the impact of thermo-mechanical...
The simulation of aging induced degradation mechanisms is a challenging task during the design of digital systems. Parametrical degradations can be handled most accurately at TCAD level, as the physical models like [1] and [2] can be implemented directly. On the other hand, timing failures caused by such degradations cannot be assessed exactly lower than Register Transfer Level (RTL), where the notion...
The simulation of aging related degradation mechanisms is a challenging task for timing and reliability estimations during all design phases of digital systems. Some good approaches towards accurate, efficient and applicable timing models at the register transfer level (RTL) have already been made. However recent state-of-the-art models often have to access lower levels of abstraction, such as the...
We present a new system-level design methodology enabling the consideration of process variations and degradation due to aging in early stages of the design process. By mapping an executable system specification to SoC processing, communication and memory components in combination with component wise timing and power characterization with a source-level back-annotation, we enable efficient full SoC...
The aging effect “Negative Bias Temperature Instability”, which is highly dependent on device history, has a direct impact on the design of integrated circuits. In order to make realistic predictions available in the design process, simulation durations of existing history aware models must be significantly reduced. Therefore, a performance-oriented, yet accurate abstraction of the switching trap...
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