Search results for: Youngsoo Shin
IEEE Design & Test of Computers > 2011 > 28 > 6 > 50 - 57
Design Automation Conference > 280 - 285
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 3 > 355 - 366
IEEE Design & Test of Computers > 2011 > 28 > 6 > 50 - 57
Design Automation Conference > 280 - 285
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 3 > 355 - 366