Search results for: Yunfei En
Microwave and Optical Technology Letters > 64 > 7 > 1224 - 1228
International Journal of RF and Microwave Computer‐Aided Engineering > 29 > 1 > n/a - n/a
Microsystem Technologies > 2019 > 25 > 8 > 3097-3103
IEEE Transactions on Instrumentation and Measurement > 2017 > 66 > 9 > 2464 - 2473
Microelectronics Reliability > 2017 > 75 > C > 135-141
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 3 > 970 - 979
Electrochimica Acta > 2016 > 218 > C > 1-7
IEEE Transactions on Electromagnetic Compatibility > 2015 > 57 > 6 > 1338 - 1344
2015 IEEE International Reliability Physics Symposium > PR.1.1 - PR.1.4