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A method for the optimization of the efficiency of alternate tests for adjustable RF mixers is presented in this paper. Alternate tests provide a cost- and time-effective substitute for their conventional specification-based counterparts by attempting to predict rather than directly measuring a circuit's performance from its response to suitable test stimuli. In order to provide post-manufacture yield...
A Build-In Self-Test (BiST) circuit suitable for embedded RF Mixers in System-on-Chip applications is presented in this paper. This is a defect-oriented test scheme that dynamically sets the Mixer to operate in homodyne mode. The DC level generated at its output is used to control the oscillation frequency of a simple voltage controlled oscillator. Deviations of the oscillation frequency from the...
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