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We have studied Cu coatings grown on AlN substrates via a polyol deposition method using grazing incidence X-ray (GIXS) techniques and small angle scattering techniques to determine the dependence of film structure on depth as well as the presence of nanometer size structures in the films. Small angle measurements indicate the presence of ordered structures in the order of 4 nm close to the surface...
Results are given for preliminary experiments on processing of conventional and nanophase ceramic materials by conventional (2.45GHz) and high frequency (≥35 GHz) microwave processing. Characterization of materials processed under different conditions (time, temperature, frequency) includes XRD, density, and microstructure. The basis for such experimentation is discussed briefly, including results...
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