Search results for: Junrui Qin
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 639 - 644
IEEE Transactions on Nuclear Science > 2014 > 61 > 1-3 > 646 - 653
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 639 - 644
IEEE Transactions on Nuclear Science > 2014 > 61 > 1-3 > 646 - 653