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In this study, we performed single-grain-boundary characterization of ferrite films at radio and microwave frequencies using scanning microwave microscopy (SMM). The sample consisted of Fe3O4/photoresist/Fe3O4 multilayers deposited on glass substrate at 90°C by spin-spray coating. SMM images were recorded at various resonant frequencies between 2.0 GHz and 8.0 GHz. These images showed higher electrical...
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