The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The measurement of device thermal resistance is a common approach to junction temperature determination given a set of environmental conditions and the device power dissipation. This paper introduces a novel instrument that can measure the thermal resistance of high brightness LED quickly using electrical test method (ETM). According to the international JEDEC standard, the instrument uses the LED...
Molecular-orbital calculations on the ground states and optical excitation states corresponding to low energy valence UV spectra of MX 4 (M = Ti, Zr, Hf; X = Cl, Br) are carried out using both self-consistent one-electron nonrelativistic Hartree-Fock-Slater and fully relativistic Dirac-Fock-Slater discrete variational Local-density functional methods within the self-consistent multipolar (SCM)...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.