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Innovative advance dielectric materials were utilized to fabricate novel thin film capacitor device. This includes ceramic and polymeric material combination which is considered to enhance the dielectric polarization. The dielectric film presented in the study focused on PbTiO3/PVDF-TrFE which was prepared through layer-by-layer spin coating deposition method. The PVDF-TrFE coating was aimed to encapsulate...
Hybrid composited material like polymer-ceramic will improve the reliability factor of the device. Yet, the motivation still goes on to produce high performance device. In this study, the impedance analysis on bilayer films lead titanate and poly(vinyledenefluoride-trifluoroethylene) yield to the semicircle cole-cole plot with added slanted spike results. This presents the double layer capacitance...
Development of innovative device design was fully utilized to fabricate hybrid composited PVDF-TrFE/PbTiO3 that having bilayered films capacitors. Step by step of layer deposition trough spin coating method had performed an optimal thickness of ∼ 319 nm PbTiO3 first layer and ∼470 nm polymer second layer. It was found that averagely 55.6 nm multigrain size of PbTiO3 performed high densification films...
This paper investigates the electrical properties of metal-insulator-semiconductor (MIS) by varying the thickness of the semiconductor layer. The MIS device was fabricated using ZnO and PMMA: TiO2 nanocomposite as semiconductor and dielectric layer, respectively. Different thickness of ZnO films was obtained by varying the deposition speed from 500 to 3000 rpm. The electrical properties of MIS showed...
This paper investigated the effect of dielectric thickness to the electrical properties metal-insulator-semiconductor (MIS) device. The MIS device were fabricated having PMMA:TiO2 and ZnO as dielectric and semiconductor layer, respectively. The PMMA:TiO2 nancomposite dielectric film were deposited at different deposition speed from 1000, 2000, 3000, 4000, 5000, 6000 rpm. Results showed that there...
The electrical, dielectric and structural properties of multilayer ZnO/MgO films prepared by simple chemical deposition technique were investigated using I-V measurement, impedance spectroscopy analyzer and field emission scanning electron microscope (FESEM). From the observation, it shows that the annealing temperature influence the electrical, dielectric and structural properties of ZnO/MgO multilayer...
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