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As the minimum transistor length reaches the deca-nanometer scale, both time-zero and time-dependent variability, the latter including Random Telegraph Noise (RTN) and Bias Temperature Instability (BTI), become a great concern for IC design. Accurate statistical models describing these two variability sources are therefore necessary in order to design reliable circuits and systems. This paper gives...
This paper presents the design and implementation of a multi-standard energy management system, which leverages heterogeneous devices to convert existing buildings into Smart Buildings. Its main purpose is to increase the energy efficiency of buildings providing user awareness to promote green behaviors. The proposed solution has been designed to enable interoperability across different standards...
This paper presents the design and implementation of an autonomous system for monitoring and managing the energy consumption in smart home applications. The work introduces a low-power Ultra-Wideband (UWB) transceiver, fully integrated into a smart home sensor node with web-services software infrastructure. This unique combination enables novel applications characterized by extreme low energy while...
Negative Bias Temperature Instability (NBTI) is one of the most important reliability concerns in nanometer CMOS technologies. Accurate models for aging effects such as NBTI can help a designer in determining and improving circuit lifetime. This paper proposes a comprehensible compact model for reliability simulation of analog integrated circuits. The proposed model includes all typical NBTI peculiarities...
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