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Transistor reliability has become one of the major concerns in reliable circuit design in advanced CMOS nanometer technology. Transistor aging can have a significant impact on the performance of the RF frontend circuits. In this paper, the impacts of transistor aging on a RF low noise amplifier (LNA) are studied. In this work, single-ended cascode LNA with source inductive degeneration and LC folded-cascode...
The paper discusses a technique to perform efficient circuit reliability analysis of large analog and mixed-signal systems. The proposed method includes the impact of both process variations and transistor aging effects. The complexity of large systems is dealt with by partitioning the system into manageable subblocks that are modeled separately. These models are then evaluated to obtain the system...
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