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Atomic Fore Microscopes (AFMs) are widely used for nanoscale applications. Until recent developments these instruments were controlled in open loop or by a PID type controller. In the last decade model-based control techniques emerged for controlling AFMs, but in almost all cases the multivariable behavior was ignored. In this paper, we present a multivariable control strategy using the standard plant...
To reduce cross coupling in the control of multi-input multi-output (MIMO) motion systems having diagonal dominance, a dynamic decoupling design is studied. The dynamic decoupling is used in parallel to a nominal (and static) decoupling with the aim to support a straight-forward single-input single-output (SISO) control design. For a six degrees-of-freedom nano-accurate wafer stage, the off-diagonal...
Atomic Force Microscopes (AFMs) are widely used for the investigation of samples at nanometer scale. In this paper, we present the modeling, the identification and the control of a metrological AFM. The metrological AFM is used for the calibration of transfer standards for commercial AFMs. Therefore, the focus of the presented work is on scanning accuracy rather than on scanning speed. The contribution...
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