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Conductive atomic force microscopy (CAFM) and Kelvin force microscopy (KFM) were used to measure the resistance of isolated single-walled carbon nanotubes (SWNTs). By analyzing the current map and surface potential obtained from CAFM and KFM methods respectively, the intrinsic resistance of SWNTs could be calculated. The results calculated by these two methods are the same for the same batch of SWNTs,...
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