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The time-dependent variation caused by Negative Bias Temperature Instability (NBTI) is agreed to be one of the main reliability concerns in integrated circuits implemented with current nanotechnology nodes. NBTI increases the threshold voltage of pMOS transistors: hence, it slows down signal propagation along logic paths between flip-flops. It may cause intermittent faults and, ultimately, permanent...
The Negative Bias Temperature Instability (NBTI) phenomenon is agreed to be one of the main reliability concerns in nanoscale circuits. It increases the threshold voltage of pMOS transistors, thus, slows down signal propagation along logic paths between flip-flops. NBTI may cause intermittent faults and, ultimately, the circuit’s permanent functional failures. In this paper, we propose an innovative...
One of the main reliability concerns in the nanoscale logic is the time-dependent variation caused by Negative Bias Temperature Instability (NBTI). It increases the switching threshold voltage of pMOS transistors and as a result slows down signal propagation along the paths between flip-flops, thus causing functional failures in the circuit. In this paper we propose an approach to identify NBTI-critical...
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