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This paper presents an ATPG framework for IDDQ testing of both intra- and inter-gate bridging faults. The framework integrates random simulation and a deterministic stage using Boolean SATisfiability (SAT) as the underlying engine. This decides whether a fault is testable or untestable. In this way, we conduct an exact search for test patterns for IDDQ testing of both intra- and inter-gate bridging...
This paper proposes a minimum-width multi-row transistor placement method for CMOS cells in presence of non-dual P and N type transistors. This is the first exact multi-row transistor placement method which can be applied to CMOS cells with any types of structure. Non-dual CMOS cells occupy a major part of an industrial standard-cell library. To generate the exact minimum-width transistor placement...
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