Search results for: P.T. Lai
Microelectronics Reliability > 2003 > 43 > 1 > 163-166
Microelectronics Reliability > 2002 > 42 > 12 > 1985-1989
Microelectronics Reliability > 2002 > 42 > 3 > 455-458
Journal of Physics and Chemistry of Solids > 2001 > 62 > 6 > 1111-1115
Solid State Electronics > 2001 > 45 > 3 > 471-474
Solid State Electronics > 2001 > 45 > 3 > 431-433
Sensors & Actuators: A. Physical > 2000 > 86 > 3 > 226-230
Solid State Electronics > 2000 > 44 > 3 > 527-534
Applied Physics A > 2000 > 70 > 1 > 101-105
Microelectronics Reliability > 1998 > 38 > 12 > 1925-1929
Microelectronics Reliability > 1998 > 38 > 9 > 1425-1431
Microelectronics Reliability > 1998 > 38 > 9 > 1407-1411
Sensors & Actuators: A. Physical > 1997 > 58 > 1 > 85-88