Search results for: A. Paccagnella
Microelectronics Reliability > 2012 > 52 > 1 > 289-293
Microelectronics Reliability > 2010 > 50 > 9-11 > 1837-1841
Microelectronics Reliability > 2010 > 50 > 9-11 > 1832-1836
Microelectronics Reliability > 2007 > 47 > 9-11 > 1349-1352
Microelectronics Reliability > 2007 > 47 > 4-5 > 602-605
Microelectronics Reliability > 2006 > 46 > 9-11 > 1750-1753
Microelectronics Reliability > 2006 > 46 > 9-11 > 1669-1672
Microelectronics Reliability > 2003 > 43 > 8 > 1247-1251
Microelectronics Reliability > 2000 > 40 > 8-10 > 1347-1352
Microelectronics Reliability > 2000 > 40 > 4-5 > 715-718
Microelectronics Reliability > 2000 > 40 > 1 > 57-67
Microelectronics Reliability > 1999 > 39 > 6-7 > 827-832
Microelectronics Reliability > 1999 > 39 > 2 > 197-201
Microelectronics Reliability > 1999 > 39 > 2 > 221-226
Microelectronics Reliability > 1999 > 39 > 2 > 227-233
Microelectronics Reliability > 1998 > 38 > 6-8 > 1227-1232
Microelectronics Reliability > 1998 > 38 > 6-8 > 919-924
Microelectronics Reliability > 1998 > 38 > 2 > 195-199
Microelectronics Reliability > 1998 > 38 > 2 > 189-193
Microelectronics Reliability > 1996 > 36 > 7-8 > 1033-1044