Search results for: V. Ramachandran
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3212 - 3218
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3115 - 3121
IEEE Transactions on Nuclear Science > 2008 > 55 > 4-1 > 2013 - 2018
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 542 - 549