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Dielectric (1-x)SrTiO3/xSiO2 (x=0, 0.01, 0.05 and 0.1) composite thin films were deposited onto Pt (100)/Ti/SiO2/Si substrates via sol-gel and spin coating technology and their surface morphology was examined by field emission scanning electron microscopy, indicating that surface morphology was apparently influenced by the nano-SiO2 addition. A broad adsorption band at 3200–3500cm−1 attributed to...
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