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In semiconductor device fabrication, continual demand for high performance, high yield devices has caused designers to look to post-production tunable circuits as the next logical step in analog/RF design and test development. These approaches have not yet achieved the maturity necessary for industrial adoption, primarily due to complexity and cost. In this work, we develop a general model which systematically...
A stand-alone built-in self-test architecture mainly consists of three components: a stimulus generator, measurement acquisition sensors, and a measurement processing mechanism to draw out a straightforward Go/No-Go test decision. In this paper, we discuss the design of a neural network circuit to perform the measurement processing step. In essence, the neural network implements a non-linear classifier...
This paper discusses the generation of information-rich, arbitrarily-large synthetic data sets which can be used to (a) efficiently learn tests that correlate a set of low-cost measurements to a set of device performances and (b) grade such tests with parts per million (PPM) accuracy. This is achieved by sampling a non-parametric estimate of the joint probability density function of measurements and...
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