The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
In semiconductor manufacturing, a wealth of wafer-level measurements, generally termed inline data, are collected from various on-die and between-die (kerf) test structures and are used to provide characterization engineers with information on the health of the process. While it is generally believed that these measurements also contain valuable information regarding die performances, the vast amount...
In semiconductor device fabrication, continual demand for high performance, high yield devices has caused designers to look to post-production tunable circuits as the next logical step in analog/RF design and test development. These approaches have not yet achieved the maturity necessary for industrial adoption, primarily due to complexity and cost. In this work, we develop a general model which systematically...
A stand-alone built-in self-test architecture mainly consists of three components: a stimulus generator, measurement acquisition sensors, and a measurement processing mechanism to draw out a straightforward Go/No-Go test decision. In this paper, we discuss the design of a neural network circuit to perform the measurement processing step. In essence, the neural network implements a non-linear classifier...
Several existing methodologies have leveraged the correlation between the non-RF and the RF performances of a circuit in order to predict the latter from the former and, thus, reduce test cost. While this form of specification test compaction eliminates the need for expensive RF measurements, it also comes at the cost of reduced test accuracy, since the retained non-RF measurements and pertinent correlation...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.