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In semiconductor manufacturing, a wealth of wafer-level measurements, generally termed inline data, are collected from various on-die and between-die (kerf) test structures and are used to provide characterization engineers with information on the health of the process. While it is generally believed that these measurements also contain valuable information regarding die performances, the vast amount...
This paper discusses the relative importance of errors in a modern microprocessor based on the impact that they incur on the execution of typical workload. These information can prove immensely useful in allocating resources to enhance on-line testability and error resilience through concurrent error detection/correction methods. This paper also presents an extensive fault simulation infrastructure...
We discuss the results of an extensive fault simulation study involving the control logic of a modern alpha-like microprocessor. In this comparative study, faults are injected in both the RT- and the Gate-Level description of the design and are simulated under actual workload of the microprocessor, which is executing SPEC2000 benchmarks. The objective of this study is to analyze and contrast the impact...
This paper discusses the generation of information-rich, arbitrarily-large synthetic data sets which can be used to (a) efficiently learn tests that correlate a set of low-cost measurements to a set of device performances and (b) grade such tests with parts per million (PPM) accuracy. This is achieved by sampling a non-parametric estimate of the joint probability density function of measurements and...
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