Search results for: B. Narasimham
2016 IEEE International Reliability Physics Symposium (IRPS) > 5C-3-1 - 5C-3-5
2014 IEEE International Reliability Physics Symposium > SE.5.1 - SE.5.5
IEEE Transactions on Nuclear Science > 2010 > 57 > 6-1 > 3176 - 3182
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 157 - 163
IEEE Transactions on Nuclear Science > 2009 > 56 > 6-1 > 3050 - 3056
IEEE Electron Device Letters > 2008 > 29 > 6 > 638 - 640