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We present novel and cost effective integration schemes with high performance analog and high voltage components to enable system-on-chip (SOC) designs in advanced CMOS technologies. The new transistors have superior analog performance compared to the standard logic devices resulting in significant area savings and greater analog functionality. The new high voltage (HV) transistors enable reliable...
In the design cycle of high-performance integrated circuits, it is common that certain components are designed directly at the transistor level. This level of design representation may not be appropriate for test generation tools that usually require a model expressed at the gate level. Logic extraction is a key step in test model generation to produce a gate-level netlist from the transistor-level...
Production test data from more than 500,000 chips is analyzed to understand the correlation between the number of defective chips detected by a set of test patterns and the coverage values of these test patterns with respect to various test metrics. Experimental results show that the gate exhaustive metric has the highest correlation when compared to the stuck-at and the bridge coverage estimate metrics,...
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