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These days it has been rapidly increasing the use of millimeter and submillimeter EM (electromagnetic) devices and systems in very broad industry and science fields. Free-space method using antennas is one of the popular methods suitable for measuring material parameters which are a prerequisite to design and to fabricate EM devices and systems used in millimeter and submillimeter frequency ranges...
In free-space material measurements, it is known that the minimum size of a planar MUT (Material Under Test) should be larger than three times the beam waist of the antenna to neglect diffraction effects at the edges of the MUT. To hold the MUT, its holder has the aperture size larger than the minimum MUT size. In the case of metal MUT holders, even though their aperture size is larger than three...
This paper presents a method using a two-tier calibration with ‘Thru-Line’ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with ‘OSL’ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived...
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