Search results for: L.J. Ernst
Microelectronics Reliability > 2007 > 47 > 2-3 > 248-251
Microelectronics Reliability > 2007 > 47 > 2-3 > 290-294
Microelectronics Reliability > 2007 > 47 > 2-3 > 240-247
Microelectronics Reliability > 2007 > 47 > 2-3 > 233-239
Microelectronics Reliability > 2007 > 47 > 2-3 > 310-318
2006 1st Electronic Systemintegration Technology Conference > 2 > 782 - 787
Microelectronics Reliability > 2006 > 46 > 9-11 > 1679-1684