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Embedded memories are increasingly identified as having potential for introducing new yield loss mechanisms at a rate, magnitude, and complexity large enough to demand major changes in fault diagnosis techniques. In particular, time-related or complex read faults that originate in the highest density areas of semiconductor designs require new methods to diagnose more complex faults affecting large...
The paper presents new discrete event counters that are based on ring generators - high performance linear feedback shift registers. These devices outperform earlier solutions by providing an unprecedented speed of operations. A complete data required to implement the new event counters is also provided.
This paper presents a novel low power test scheme integrated with the embedded deterministic test environment. It reduces switching rates in scan chains with no hardware modification. Experimental results obtained for industrial circuits indicate that switching activity can be reduced up to 23 times.
Even though embedded test compression was commercially introduced only four years ago, it has already been broadly adopted as a mainstream DFT methodology. This article discusses the basic criteria for test compression, its strengths and weakness. It also provides the characteristics of EDT (embedded deterministic test) technology
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