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The nonlinear refractive index of Silicon nanocrystals was measured by the z-scan technique. The results were used to estimate the magnitude of the self-phase modulation (SPM) effect in slot waveguide structures filled by Silicon nanocrystals.
This paper firstly reports key factors which are to be necessarily considered for the successful two-bit (four-level) cell operation in a phase-change random access memory (PRAM). They are: 1) the write-and-verify (WAV) writing of four-level resistance states; and 2) the moderate-quenched (MQ) writing of intermediate resistance levels, 3) the optimization of temporal resistance increase (so-called...
Effects of in situ annealing on adhesion and structure of thick and highly crystallized cubic boron nitride films deposited by bias assisted dc jet plasma chemical vapor deposition were investigated. Improvement of adhesion by in situ annealing was observed. The full width at half maximum of Raman and X-ray diffraction peaks decreased after in situ annealing. The calculated crystal size increases...
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