Search results for: P. Cova
Microelectronics Reliability > 2017 > 76-77 > C > 277-281
Microelectronics Reliability > 2016 > 64 > C > 507-512
Microelectronics Reliability > 2016 > 58 > C > 126-132
BMC Health Services Research > 2016 > 16 > 3 > 111-242
Microelectronics Reliability > 2015 > 55 > 9-10 > 2036-2040
IEEE Transactions on Nuclear Science > 2015 > 62 > 1-2 > 202 - 209
Microelectronics Reliability > 2014 > 54 > 9-10 > 2200-2206
Microelectronics Reliability > 2014 > 54 > 9-10 > 1916-1920
Microelectronics Reliability > 2013 > 53 > 9-11 > 1760-1765
Microelectronics Reliability > 2013 > 53 > 9-11 > 1611-1616
Microelectronics Reliability > 2013 > 53 > 9-11 > 1486-1490
Microelectronics Reliability > 2012 > 52 > 9-10 > 2465-2470
Microelectronics Reliability > 2012 > 52 > 9-10 > 2391-2396
Solid State Electronics > 2011 > 63 > 1 > 60-69