The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Ferroelectric (Pb,La)(Zr,Ti)O3 (PLZT) capacitors were fabricated with Pt, Al:ZnO (AZO), or Sn:In2O3 (ITO) top electrodes. Hydrogen- or deuterium-induced degradation was investigated for the three capacitors by annealing in a 3% H2/balance N2 or 3% D2/balance N2 ambient environment at 200 °C and 1 torr. The remnant polarization of all capacitors decreased after annealing in both H2 and D2 ambient after...
We fabricated ferroelectric (K,Na)NbO3 (KNN) capacitors on Pt(111) or Pt(100) bottom electrodes with different substrate temperature by pulsed laser deposition. The annealing effect in O2 was also investigated. KNN film on Pt(100) substrate exhibited crystal grain clearly than that on Pt(111). The 2Pr and 2Vc, measured by ferroelectric tester, of Pt/KNN/Pt(111) for 400°C and 600°C were 4.28 and 4...
La-doped lead zirconate titanate (Pb,La)(Zr,Ti)O3 (PLZT) films were prepared via chemical solution deposition. Then, Pt, Al-doped ZnO (AZO), or Sn-doped In2O3 (ITO) top electrodes were deposited on the PLZT films to investigate ferroelectric properties. Three kinds of ferroelectric capacitors were annealed in 3% D2 (with N2 as a balance gas) to compare hydrogen-induced degradation of ferroelectric...
PbLaZrTiOx (PLZT) thin films were deposited on Pt(111) substrate by the sol-gel method, then aluminum-doped zinc oxide (AZO) and indium tin oxide (ITO) top electrodes were deposited by pulsed laser deposition (PLD). We evaluated degradation characteristics by 3% hydrogen atmosphere annealing in 200°C, 1Torr. The polarization ratio of PLZT capacitors with 200 nm top electrodes thickness was maximum...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.