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Thermal cycling induced failure in power packages has been studied comparing thermal cycling (TC) with thermal shock (TS) tests by thermo-mechanical analyses. The major question for the time reduction is that after the failure mechanism and if it changes with changed loading type and duration. These questions were addressed by theoretical analyses including coupled transient thermal-mechanical analyses...
More and more dense packaging is one of the most important challenges in advanced electronics and micro technology, driven by requirements like low cost and high reliability. One way to meet these demands is to follow the so-called ldquochip in duromerrdquo approach, which allows an extremely dense integration and very short interconnects. Already in the very first design phase of advanced products,...
Experimental and FEM studies have been undertaken in order to characterize the non-Fickian behavior of moisture absorption, temperature-dependent residual moisture content and hygroscopic swelling of epoxy molding compounds exposed to moist environments. Moisture absorption and desorption tests of two molding compounds and two IC packages using these materials have been carried out by gravimetric...
This paper analyzes a transient method for the characterization of low-resistance thermal interfaces of microelectronic packages. The transient method can yield additional information about the package not available with traditional static methods at the cost of greater numerical complexity, hardware requirements, and sensitivity to noise. While the method is established for package-level thermal...
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