Search results for: L. Chusseau
Microelectronics Reliability > 2017 > 76-77 > C > 670-673
Acta Physica Polonica A > 2011 > 119 > 2 > 203-205
Acta Physica Polonica A > 2011 > 119 > 2 > 107-110
Microwave and Optical Technology Letters > 53 > 3 > 580 - 582
Procedia Chemistry > 2009 > 1 > 1 > 1135-1138
IEEE Journal of Selected Topics in Quantum Electronics > 2008 > 14 > 2 > 491 - 497
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 11 > 2398 - 2404