Search results for: H. Ryssel
Microelectronics Reliability > 2013 > 53 > 12 > 1841-1847
Journal of Plastic, Reconstructive & Aesthetic Surgery > 2012 > 65 > 12 > 1684-1691
Nuclear Inst. and Methods in Physics Research, B > 2012 > 272 > Complete > 23-27
Microelectronic Engineering > 2011 > 88 > 6 > 969-975
Microelectronic Engineering > 2011 > 88 > 4 > 499-502
Advanced Powder Technology > 2011 > 22 > 2 > 253-256
Microelectronic Engineering > 2010 > 87 > 11 > 2312-2316
Journal of Aerosol Science > 2010 > 41 > 11 > 998-1007
Microelectronic Engineering > 2010 > 87 > 5-8 > 1497-1499
Thin Solid Films > 2010 > 518 > 9 > 2323-2325
Microelectronic Engineering > 2009 > 86 > 7-9 > 1826-1829
Microelectronic Engineering > 2009 > 86 > 7-9 > 1782-1785
Solid State Electronics > 2009 > 53 > 7 > 809-813
Microelectronic Engineering > 2009 > 86 > 4-6 > 636-638
Microelectronic Engineering > 2009 > 86 > 4-6 > 548-551
Microelectronic Engineering > 2009 > 86 > 3 > 303-309