Search results for: Xing Lu
IEEE Electron Device Letters > 2017 > 38 > 6 > 752 - 755
2012 IEEE International Ultrasonics Symposium > 2206 - 2209
IEEE Electron Device Letters > 2017 > 38 > 6 > 752 - 755
2012 IEEE International Ultrasonics Symposium > 2206 - 2209