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The variation of the size of coherently-diffracting domains and strain due to annealing at moderate temperature (500 °C) has been estimated for plasma-sprayed Ni using X-ray Powder Diffraction (XRPD) and line broadening analysis in conjunction with classical and modified Williamson–Hall methods. It was found that annealing provokes a narrowing of Ni diffraction peaks which was basically associated...
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