Search results for: J. Nicolics
Microelectronics Reliability > 2017 > 74 > C > 147-154
Journal of Materials Science: Materials in Electronics > 2017 > 28 > 9 > 6794-6799
Journal of Materials Science: Materials in Electronics > 2016 > 27 > 1 > 570-579
Journal of Materials Science: Materials in Electronics > 2016 > 27 > 3 > 2430-2441
Journal of Materials Science: Materials in Electronics > 2016 > 27 > 9 > 9356-9362
Journal of Materials Science: Materials in Electronics > 2016 > 27 > 7 > 7646-7656
2015 IEEE International Reliability Physics Symposium > 5C.1.1 - 5C.1.13
Journal of Rare Earths > 2014 > 32 > 3 > 201-206