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Phase nucleation in sharp concentration gradient and the beginning of phase growth is investigated in Ni–Si and Co–Si systems experimentally and by computer simulation. We applied a combination of X-ray diffraction, four-wire resistance, grazing incidence X-ray fluorescence analysis and extended X-ray absorption fine structure spectroscopy in fluorescence detection with X-ray standing waves for the...
The nucleation of the Cu 3 Si phase was studied on sputter-deposited Cu/Si/Cu trilayered specimens both in curved and planar geometry. Two experimental methods, atom probe tomography and secondary neutral mass spectrometry, independently confirmed that the Cu on Si interface is significantly broader than the Si on Cu (5.3 vs. 2.4nm from the atom probe measurements). It is demonstrated that...
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