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Statistical static timing analysis (SSTA) considering process variation and aging effects is usually used to analyze circuit lifetime reliability at design phase. A key challenge for statistical lifetime reliability analysis is that an accurate statistical timing model is needed to carefully model practical variation distribution as well as delay correlation. In this work, P2CLRAF, a circuit lifetime...
Negative bias temperature instability (NBTI) has been a significant reliability concern in current digital circuit design due to its effect of increasing the path delay with time and in turn degrading the circuit performance. NBTI degradation has strong dependence on input pattern and duty cycles. Based on this observation, we propose to apply multiple input vectors to the combination circuit in a...
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