The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Transmission electron microscopy (TEM) images for the Al-doped ZnO (AZO) films grown on n-Si (100) substrates and annealed for 10min at 900 and 1000°C showed that an amorphous phase region appeared in the grain boundaries of the AZO thin films by tilting the TEM specimen and that the amorphous phase did not show the constrast variation with change in the zone axis of the specimen. High-resolution...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.