Search results for: S. Iyer
2016 IEEE International Electron Devices Meeting (IEDM) > 9.6.1 - 9.6.4
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2016 > 6 > 3 > 373 - 384
IEEE Solid-State Circuits Magazine > 2015 > 7 > 4 > 63 - 74
2012 International Electron Devices Meeting > 33.1.1 - 33.1.4
2012 IEEE International Reliability Physics Symposium (IRPS) > 2B.1.1 - 2B.1.4