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X-ray diffraction (XRD) was employed to analyze the texture evolution of commercial pure (CP) Ti during cold rolling and recrystallization annealing. The texture components were measured by electron backscattered diffraction (EBSD) after recrystallization annealing. The CP Ti tends to form a texture with the basal pole tilted 30°–40° away from the normal direction toward the transverse direction....
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