Search results for: W. Vandervorst
Ultramicroscopy > 2013 > 125 > Complete > 18-23
Surface and Interface Analysis > 45 > 1 > 406 - 408
Surface and Interface Analysis > 45 > 1 > 402 - 405
Surface and Interface Analysis > 45 > 1 > 430 - 433
2012 International Electron Devices Meeting > 30.2.1 - 30.2.4
2012 International Electron Devices Meeting > 6.5.1 - 6.5.4
physica status solidi c > 9 > 10‐11 > 2116 - 2119
Microelectronic Engineering > 2012 > 97 > Complete > 255-258
2012 IEEE International Reliability Physics Symposium (IRPS) > 5D.1.1 - 5D.1.10
Thin Solid Films > 2012 > 520 > 8 > 3206-3210
Thin Solid Films > 2012 > 520 > 8 > 3211-3215
Energy Procedia > 2012 > 27 > Complete > 240-246
2011 International Electron Devices Meeting > 6.1.1 - 6.1.4
2011 International Electron Devices Meeting > 35.6.1 - 35.6.4