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With the rapid development of microelectronics, it is difficult to test complicated integrated circuit for the traditional test methods. For this circs, JTAG puts forward a new kind of circuit test method — boundary scan technology. According to the IEEE1149.4, a boundary scan controller is designed by ATmega128 MCU and SN74ACT8990. Experiments show that the test controller can locate faults rapidly...
Boundary scan test is a standard measurability design technology, and it is more convenient for the measurement of complex circuits. Based on the basic principle of boundary scan and one system's CPU board, the boundary scan design and configuration of the system's control circuit are presented and validated. According to the experiments of the designed CPU, the circuit can realize the functions of...
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