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The optical IR-OBIRCh technique is a standard failure analysis tool used to localize defects that are located at interconnects layers levels. For a functional logic failure, a failing test pattern is used to condition the device into a particular logic state to generate the failure. Commonly, the defect is detected for a set of test patterns. All test patterns will not provide the same IR-OBIRCh response...
The soft defect localization on analog or mixed-mode ICs is becoming more and more challenging due to their increasing complexity and integration. New techniques based on dynamic laser stimulation are promising for analog and mixedmode ICs. Unfortunately, the considerable intrinsic sensitivity of this kind of devices under laser stimulation makes the defect localization results complex to analyze...
This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
This paper presents a simulation and experimental study of the analog single-event transient sensitivity of wide bandwidth operational amplifiers. Architecture effects are presented that could influence ASIC design and COTS selection.
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