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Nanostructured Cu/Fe multilayers on Si (110) and Si (100) substrates were prepared by magnetron sputtering, with individual layer thicknesses h varying from 0.75 to 200nm. The growth orientation relationships between Cu and Fe at the interfaces were determined to be of the Kurdjumov–Sachs and Nishiyama–Wasserman type. Nanoscale columnar grains in Fe, with an average grain size of 11–23nm, played a...
We report on the synthesis of highly (111) and (100) textured Cu/Ni multilayers with individual layer thicknesses, h, varying from 1 to 200nm. When, h, decreases to 5nm or less, X-ray diffraction spectra show epitaxial growth of Cu/Ni multilayers. High resolution transmission electron microscopy studies show the coexistence of nanotwins and coherent layer interfaces in highly (111) textured Cu/Ni...
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