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With the introduction of the Internet of Things (IoT), power consumption became a major design issue in modern system-on-chips. In advanced technologies, leakage power has become a dominant component, especially during sleep periods. Leakage mainly comes from volatile memory elements, e.g., flip-flops that cannot be power-gated in order to retain their states. Non-Volatile Flip-Flop (NVFF) using emerging...
With the saturation of the Flash memory technologies scaling under the 20nm nodes, new technology opportunities are explored by both industrial and academic research teams. Resistive switching memories are today seen as the most promising replacement candidate for both embedded (NOR) and stand-alone (NAND) flash memories. The native Back-End-of-Line (BEoL) integration enabled by the RRAM technologies...
Passive crossbar memories based on resistive switching bit-cells are today seen as the most promising candidates for flash memories replacement. However, inherent sneak currents through unselected devices lead to low operating margins and over-consumption during read and programing operations. Crossbar memory simulations with bit-cells based on two terminal nonlinear selectors, also show degraded...
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