The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
This paper presents a scalable method to generate close to minimal size test pattern sets for stuck-at faults in scan based circuits. The method creates sets of potentially compatible faults based on necessary assignments. It guides the justification and propagation decisions to create patterns that will accommodate most targeted faults. The technique presented achieves close to minimal test pattern...
We present the automatic test pattern generator TIGUAN based on a thread-parallel SAT solver. Due to a tight integration of the SAT engine into the ATPG algorithm and a carefully chosen mix of various optimization techniques, multi-million-gate industrial circuits are handled without aborts. TIGUAN supports both conventional single-stuck-at faults and sophisticated conditional multiple stuck-at faults...
As digital circuits grow in gate count so does the data volume required for manufacturing test. To address this problem several test compression techniques have been developed. This paper presents a novel and scalable technique for inserting observation points to aid compression by reducing pattern count and data volume. Experimental results presented for industrial circuits demonstrate the effectiveness...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.