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Bridging and interconnect open faults are defined using subsets of lines. We study the possibility of identifying input vectors that are effective as test vectors for such faults without enumerating the faults. This process does not require accurate layout information, it can handle very large numbers of faults, and it deals with undetectable faults implicitly. We describe a static test compaction...
A recent approach to test generation avoids the assignment of certain input values in order not to prevent target faults from being detected. The test generation process based on this approach is efficient; however, it generates large test sets. We develop a dynamic test compaction procedure for this approach. Our goal is to reduce the test set size by increasing the number of faults detected by each...
An n-detection test set contains different tests for each target fault. The value of is typically determined based on test set size constraints, and certain values have become standard. Appropriate values for are investigated in this paper by considering the saturation of the n-detection test generation process. As is increased, eventually, the rate of increase in test set quality starts dropping...
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